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  1. Probe Card - Test Sockets - PCB Solutions for Semiconductor Wafer and Device Test by APS

    APS provides Probecards for Wafer Probing, Test Sockets for IC Component Test, and Multilayer PCB for Wafer-, Device- and IC Test
    pcb2
    SBS2
    shelf2
    APS2
    tungsten1
    Printed Circuit Board1
    cantilever1
    Multilayer1
    contactor1
    MJC1
    spring pin1
    fine pitch1
    pogo pin1
    probe card1
    IC Test1
    Probecard1
    test contactor1
    Wafer Test1
    Device Test1
    Prüfkarten1
    probe needles1
    vertical probe card1
    epoxy ring1
    testsocket1
    kelvin socket0
    multi DUT0
    Performance Board0
    rhenium-tungsten0
    strip test socket0
    Synergie CAD0
    tungsten-rhenium0

    www.aps-munich.com - 2009-02-12

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